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Pasted as Bash by s1 ( 15 years ago )
s1:~# smartctl --all /dev/sdb
smartctl 5.40 2010-07-12 r3124 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     WDC WD5003ABYX-01WERA0
Serial Number:    WD-WMAYP0415724
Firmware Version: 01.01S01
User Capacity:    500,107,862,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Thu Jun  2 14:11:14 2011 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
     was completed without error.
     Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
     without error or no self-test has ever 
     been run.
Total time to complete Offline 
data collection:    (8100) seconds.
Offline data collection
capabilities:     (0x7b) SMART execute Offline immediate.
     Auto Offline data collection on/off support.
     Suspend Offline collection upon new
     command.
     Offline surface scan supported.
     Self-test supported.
     Conveyance Self-test supported.
     Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
     power-saving mode.
     Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
     General Purpose Logging supported.
Short self-test routine 
recommended polling time:   (   2) minutes.
Extended self-test routine
recommended polling time:   (  86) minutes.
Conveyance self-test routine
recommended polling time:   (   5) minutes.
SCT capabilities:         (0x303f) SCT Status supported.
     SCT Error Recovery Control supported.
     SCT Feature Control supported.
     SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   142   142   021    Pre-fail  Always       -       3858
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       12
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   200   200   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       237
 10 Spin_Retry_Count        0x0032   100   253   000    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       10
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       8
193 Load_Cycle_Count        0x0032   200   200   000    Old_age   Always       -       3
194 Temperature_Celsius     0x0022   117   109   000    Old_age   Always       -       26
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   200   200   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   200   200   000    Old_age   Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 1
 CR = Command Register [HEX]
 FR = Features Register [HEX]
 SC = Sector Count Register [HEX]
 SN = Sector Number Register [HEX]
 CL = Cylinder Low Register [HEX]
 CH = Cylinder High Register [HEX]
 DH = Device/Head Register [HEX]
 DC = Device Command Register [HEX]
 ER = Error register [HEX]
 ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 01 37 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d6 01 be 4f c2 00 00      00:00:57.130  SMART WRITE LOG
  80 45 00 00 44 57 00 00      00:00:57.128  [VENDOR SPECIFIC]
  b0 d5 01 bd 4f c2 00 00      00:00:56.546  SMART READ LOG
  b0 d5 01 bd 4f c2 00 00      00:00:56.543  SMART READ LOG
  b0 d5 20 bf 4f c2 00 00      00:00:56.540  SMART READ LOG

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%        18         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

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